Francisco André Corrêa Alegria

According to our database1, Francisco André Corrêa Alegria authored at least 21 papers between 2000 and 2012.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2012
Choosing Between Terminal and Independently Based Gain and Offset Error in the ADC Histogram Test.
IEEE Trans. Instrum. Meas., 2012

Precision of harmonic amplitude estimation on jitter corrupted data using sine fitting.
Signal Process., 2012

2010
Liftoff Correction Based on the Spatial Spectral Behavior of Eddy-Current Images.
IEEE Trans. Instrum. Meas., 2010

Cross-Correlation and Sine-Fitting Techniques for High-Resolution Ultrasonic Ranging.
IEEE Trans. Instrum. Meas., 2010

Gaussian Jitter-Induced Bias of Sine Wave Amplitude Estimation Using Three-Parameter Sine Fitting.
IEEE Trans. Instrum. Meas., 2010

2009
IEEE 1057 Jitter Test of Waveform Recorders.
IEEE Trans. Instrum. Meas., 2009

The Histogram Test of ADCs With Sinusoidal Stimulus Is Unbiased by Phase Noise.
IEEE Trans. Instrum. Meas., 2009

Precision of Independently Based Gain and Offset Error of an ADC Using the Histogram Method.
IEEE Trans. Instrum. Meas., 2009

2008
Implementation Details of an Automatic Monitoring System Used on a Vodafone Radiocommunication Base Station.
Eng. Lett., 2008

2007
Standard Histogram Test Precision of ADC Gain and Offset Error Estimation.
IEEE Trans. Instrum. Meas., 2007

Developing and Integrating Lab Projects as Important Learning Components in an Embedded Systems Course.
Proceedings of the IEEE International Conference on Microelectronic Systems Education, 2007

2006
ADC transfer curve types - A review.
Comput. Stand. Interfaces, 2006

2005
Overdrive in the ramp histogram test of ADCs.
IEEE Trans. Instrum. Meas., 2005

Uncertainty of ADC random noise estimates obtained with the IEEE 1057 standard test.
IEEE Trans. Instrum. Meas., 2005

Effective ADC linearity testing using sinewaves.
IEEE Trans. Circuits Syst. I Regul. Pap., 2005

2004
Performance of data acquisition systems from the user's point of view.
IEEE Trans. Instrum. Meas., 2004

Analog-to-digital converter testing - new proposals.
Comput. Stand. Interfaces, 2004

2003
Variance of the cumulative histogram of ADCs due to frequency errors.
IEEE Trans. Instrum. Meas., 2003

2002
Performance analysis of an ADC histogram test using small triangular waves.
IEEE Trans. Instrum. Meas., 2002

2001
Influence of frequency errors in the variance of the cumulative histogram [in ADC testing].
IEEE Trans. Instrum. Meas., 2001

2000
Automatic calibration of analog and digital measuring instruments using computer vision.
IEEE Trans. Instrum. Meas., 2000


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