Ayhan A. Mutlu

According to our database, Ayhan A. Mutlu authored at least 7 papers between 2003 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2013

A new statistical methodology predicting chip failure probability considering electromigration.

Ted Sun, Ayhan A. Mutlu, Mahmudur Rahman

Microelectron. Reliab., 2013

Statistical Electromigration analysis of a chip with the consideration of a within-die temperature map.

Ted Sun, Ayhan A. Mutlu, Mahmud Rahman

Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

2009

Parametric analysis to determine accurate interconnect extraction corners for design performance.

Ayhan A. Mutlu, Jiayong Le, Ruben Molina, Mustafa Celik

Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009

A parametric approach for handling local variation effects in timing analysis.

Ayhan A. Mutlu, Jiayong Le, Ruben Molina, Mustafa Celik

Proceedings of the 46th Design Automation Conference, 2009

2007

An Exploratory Study on Statistical Timing Analysis and Parametric Yield Optimization.

Ayhan A. Mutlu, Kelvin J. Le, Mustafa Celik, Dar-sun Tsien, Garry Shyu, Long-Ching Yeh

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

2006

Statistical circuit performance variability minimization under manufacturing variations.

Ayhan A. Mutlu, Charles Kwong, Abir Mukherjee, Mahmud Rahman

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

2003

Concurrent optimization of process dependent variations in different circuit performance measures.

Ayhan A. Mutlu, Norman G. Gunther, Mahmud Rahman

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003