Baisakhi Das

Orcid: 0000-0002-0702-5855

According to our database1, Baisakhi Das authored at least 12 papers between 2011 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2022
Identification of Periodic Boundary SACA Rules Exploring NSRT Diagram.
Proceedings of the Cellular Automata, 2022

2020
Exploring Hard to Detect Sequential Hardware Trojans.
Proceedings of the 2020 24th International Symposium on VLSI Design and Test (VDAT), 2020

2019
Effect of Trojans on Write Data Access in Memory.
Proceedings of the 9th International Symposium on Embedded Computing and System Design, 2019

2018
Stuck-At 0/1 Trojans on Return Address Stack.
Proceedings of the 8th International Symposium on Embedded Computing and System Design, 2018

Evaluation of Misspeculation Impact on Chip-Multiprocessors Power Overhead.
Proceedings of the 7th International Conference on Software and Computer Applications, 2018

2017
E-Learning System of Asia Through Open Courseware (OCW) and Educational Resources (OER) for Universal Access to Knowledge and Information.
Int. J. Web Based Learn. Teach. Technol., 2017

Evaluating impact on CMPs' power for design inaccuracy diagnosis.
Int. J. Comput. Appl. Technol., 2017

Periodic boundary cellular automata based test structure for memory.
Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

2016
Design of CA based scheme for evenhanded data migration in CMPs.
Proceedings of the Sixth International Symposium on Embedded Computing and System Design, 2016

2013
Design of an Efficient Scheme for Data Migration in Chip-Multiprocessors.
Proceedings of the 2013 International Symposium on Electronic System Design, 2013

2011
Impact of Inaccurate Design of Branch Predictors on Processors' Power Consumption.
Proceedings of the IEEE Ninth International Conference on Dependable, 2011

Exploring Impact of Faults on Branch Predictors' Power for Diagnosis of Faulty Module.
Proceedings of the 20th IEEE Asian Test Symposium, 2011


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