Baofu Zhu

According to our database, Baofu Zhu authored at least 2 papers between 2019 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation.

Zhiqing Li, Baofu Zhu, Anindya Nath, Meng Miao, Alain Loiseau, You Li, Jeffrey B. Johnson, Souvick Mitra, Robert Gauthier

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

HCI Improvement on 14nm FinFET IO Device by Optimization of 3D Junction Profile.

Xinggon Wan, Baofu Zhu, Meera Mohan, Keija Wu, Dongil Choi, Arfa Gondal

Proceedings of the IEEE International Reliability Physics Symposium, 2019