Baohu Li

According to our database, Baohu Li authored at least 4 papers between 2013 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Applications of Mixed-Signal Technology in Digital Testing.

Baohu Li, Vishwani D. Agrawal

J. Electron. Test., 2016

2015

Multivalued Logic for Reduced Pin Count and Multi-site SoC Testing.

Baohu Li, Vishwani D. Agrawal

Proceedings of the 24th IEEE North Atlantic Test Workshop, 2015

Adopting multi-valued logic for reduced pin-count testing.

Baohu Li, Bei Zhang, Vishwani D. Agrawal

Proceedings of the 16th Latin-American Test Symposium, 2015

2013

Yield analysis of a novel wafer manipulation method in 3D stacking.

Bei Zhang, Baohu Li, Vishwani D. Agrawal

Proceedings of the 2013 IEEE International 3D Systems Integration Conference (3DIC), 2013