Bas Verhelst

According to our database1, Bas Verhelst authored at least 5 papers between 1990 and 1992.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

1992
Using EDIF for Transfer of Test Data: Practical Experience.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1990
Using a Test-Specification Format in Automatic Test-Program Generation.
IEEE Des. Test Comput., 1990

Development of a new standard for test.
Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

Functional and I<sub>DDQ</sub> testing on a static RAM.
Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

I<sub>DDQ</sub> testing because 'zero defects isn't enough': a Philips perspective.
Proceedings of the Proceedings IEEE International Test Conference 1990, 1990


  Loading...