Loek Thijssen

According to our database, Loek Thijssen authored at least 6 papers between 1988 and 1993.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1993

Minimizing Test Time by Exploiting Parallelism in Macro Test.

Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1990

A realistic fault model and test algorithms for static random access memories.

Rob Dekker, Frans P. M. Beenker, Loek Thijssen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990

Functional and I_DDQ testing on a static RAM.

R. Meershoek, Bas Verhelst, Rory McInerney, Loek Thijssen

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1989

Realistic built-in self-test for static RAMs.

Rob Dekker, Frans P. M. Beenker, Loek Thijssen

IEEE Des. Test, 1989

1988

A Realistic Self-Test Machine for Static Random Access Memories.

Frans P. M. Beenker, Rob Dekker, Loek Thijssen

Proceedings of the Proceedings International Test Conference 1988, 1988

Fault Modeling and Test Algorithm Development.

Frans P. M. Beenker, Rob Dekker, Loek Thijssen

Proceedings of the Proceedings International Test Conference 1988, 1988