Brad Cobb

According to our database1, Brad Cobb authored at least 4 papers between 2000 and 2004.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2004
Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects.
Proceedings of the 2004 Design, 2004

2002
Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults.
Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002

A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults.
Proceedings of the 2002 Design, 2002

2000
On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction.
Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000


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