Byeong Min

According to our database1, Byeong Min authored at least 13 papers between 2000 and 2012.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2012
System-level simulation acceleration for architectural performance analysis using hybrid virtual platform system.
Proceedings of the International SoC Design Conference, 2012

Millions to thousands issues through knowledge based SoC CDC verification.
Proceedings of the International SoC Design Conference, 2012

How to automate millions lines of top-level UVM testbench and handle huge register classes.
Proceedings of the International SoC Design Conference, 2012

Verification of massive advanced node SoCs.
Proceedings of the International SoC Design Conference, 2012

2011
Beyond UVM for practical SoC verification.
Proceedings of the International SoC Design Conference, 2011

An efficient GPIO block design methodology using formalized SFR description.
Proceedings of the International SoC Design Conference, 2011

2008
An Open-Loop Flow Control Scheme Based on the Accurate Global Information of On-Chip Communication.
Proceedings of the Design, Automation and Test in Europe, 2008

A practical approach of memory access parallelization to exploit multiple off-chip DDR memories.
Proceedings of the 45th Design Automation Conference, 2008

2001
ECC: Extended Condition Coverage for Design Verification Using Excitation and Observation.
Proceedings of the 8th Pacific Rim International Symposium on Dependable Computing (PRDC 2001), 2001

Simulation Using Code-Perturbation: Black- and White-Box Approach.
Proceedings of the 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 2001

RTL functional verification using excitation and observation coverage.
Proceedings of the Sixth IEEE International High-Level Design Validation and Test Workshop 2001, 2001

2000
Verification Simulation Acceleration Using Code-Perturbation.
J. Electron. Test., 2000

Si-emulation: system verification using simulation and emulation.
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000


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