Byoungho Kim

According to our database, Byoungho Kim authored at least 17 papers between 2006 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

Built-in Harmonic Prediction Scheme for Embedded Segmented-Data-Converters.

Byoungho Kim, Jacob A. Abraham

IEEE Access, 2020

2019

Spectral Leakage-Driven Loopback Scheme for Prediction of Mixed-Signal Circuit Specifications.

Byoungho Kim, Jacob A. Abraham

IEEE Trans. Ind. Electron., 2019

2016

A Low-Power Incremental Delta-Sigma ADC for CMOS Image Sensors.

Ilseop Lee, Byoungho Kim, Byung-Geun Lee

IEEE Trans. Circuits Syst. II Express Briefs, 2016

Dithering Loopback-Based Prediction Technique for Mixed-Signal Embedded System Specifications.

Byoungho Kim

IEEE Trans. Circuits Syst. II Express Briefs, 2016

2015

A 10-bit 200-MS/s Zero-Crossing-Based Pipeline ADC in 0.13-µm CMOS Technology.

Myonglae Chu, Byoungho Kim, Byung-Geun Lee

IEEE Trans. Very Large Scale Integr. Syst., 2015

Neuromorphic Hardware System for Visual Pattern Recognition With Memristor Array and CMOS Neuron.

Myonglae Chu, Byoungho Kim, Sangsu Park, Hyunsang Hwang, Moongu Jeon, Byoung Hun Lee, Byung-Geun Lee

IEEE Trans. Ind. Electron., 2015

2014

Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal Embedded Circuits.

Byoungho Kim, Jacob A. Abraham

IEEE Trans. Circuits Syst. II Express Briefs, 2014

Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits.

Byoungho Kim, Jacob A. Abraham

IEEE Trans. Circuits Syst. II Express Briefs, 2014

2013

Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems.

Byoungho Kim, Jacob A. Abraham

IEEE Trans. Circuits Syst. II Express Briefs, 2013

2012

Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems.

Byoungho Kim, Jacob A. Abraham

IEEE Trans. Circuits Syst. II Express Briefs, 2012

2011

Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications.

Byoungho Kim, Jacob A. Abraham

IEEE Trans. Instrum. Meas., 2011

Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits.

Byoungho Kim, Jacob A. Abraham

IEEE Trans. Circuits Syst. I Regul. Pap., 2011

2008

Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits.

Byoungho Kim, Nash Khouzam, Jacob A. Abraham

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

2007

Predicting mixed-signal dynamic performance using optimised signature-based alternate test.

Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham

IET Comput. Digit. Tech., 2007

Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications.

Byoungho Kim, Zhenhai Fu, Jacob A. Abraham

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

2006

Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.

Hongjoong Shin, Byoungho Kim, Jacob A. Abraham

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters.

Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham

Proceedings of the 11th European Test Symposium, 2006