Byungwhan Kim

According to our database1, Byungwhan Kim authored at least 16 papers between 2002 and 2013.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

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Bibliography

2013
Exponentially weighted moving average-based procedure with adaptive thresholding for monitoring nonlinear profiles: Monitoring of plasma etch process in semiconductor manufacturing.
Expert Syst. Appl., 2013

2012
Design and VLSI implementation of a high-performance face detection engine.
Comput. Electr. Eng., 2012

Use of neural network to in situ conditioning of semiconductor plasma processing equipment.
Appl. Soft Comput., 2012

2011
Neural network modeling of inter-characteristics of silicon nitride film deposited by using a plasma-enhanced chemical vapor deposition.
Expert Syst. Appl., 2011

Wavelet-coupled backpropagation neural network as a chamber leak detector of plasma processing equipment.
Expert Syst. Appl., 2011

2010
Optimization of optical lens-controlled scanning electron microscopic resolution using generalized regression neural network and genetic algorithm.
Expert Syst. Appl., 2010

2009
Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties.
Expert Syst. Appl., 2009

Use of neural network to model X-ray photoelectron spectroscopy data for diagnosis of plasma etch equipment.
Expert Syst. Appl., 2009

Modeling of Thin Film Process Data Using a Genetic Algorithm-Optimized Initial Weight of Backpropagation Neural Network.
Appl. Artif. Intell., 2009

2007
Adaptive Network-Based Fuzzy Inference Model of Plasma Enhanced Chemical Vapor Deposition Process.
Proceedings of the Advances in Neural Networks, 2007

2006
Diagnosis Model of Radio Frequency Impedance Matching in Plasma Equipment by Using Neural Network and Wavelets.
Proceedings of the PRICAI 2006: Trends in Artificial Intelligence, 2006

Neural Network Recognition of Scanning Electron Microscope Image for Plasma Diagnosis.
Proceedings of the PRICAI 2006: Trends in Artificial Intelligence, 2006

Prediction of Plasma Enhanced Deposition Process Using GA-Optimized GRNN.
Proceedings of the Advances in Neural Networks - ISNN 2006, Third International Symposium on Neural Networks, Chengdu, China, May 28, 2006

Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network.
Proceedings of the Advances in Neural Networks - ISNN 2006, Third International Symposium on Neural Networks, Chengdu, China, May 28, 2006

Prediction of Radio Frequency Impedance Matching in Plasma Equipment Using Neural Network.
Proceedings of the Advances in Neural Networks - ISNN 2006, Third International Symposium on Neural Networks, Chengdu, China, May 28, 2006

2002
Fuzzy Logic Model of Langmuir Probe Discharge Data.
Comput. Chem., 2002


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