Sang Jeen Hong

According to our database, Sang Jeen Hong authored at least 12 papers between 2005 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data.

Jeong Eun Choi, Da Hoon Seol, Chan Young Kim, Sang Jeen Hong

Sensors, February, 2023

2014

Fault Detection in the Semiconductor Etch Process Using the Seasonal Autoregressive Integrated Moving Average Modeling.

Muhammad Zeeshan Arshad, Javeria Muhammad Nawaz, Sang Jeen Hong

J. Inf. Process. Syst., 2014

2013

Time Series Fault Prediction in Semiconductor Equipment Using Recurrent Neural Network.

Javeria Muhammad Nawaz, Muhammad Zeeshan Arshad, Sang Jeen Hong

Proceedings of the Advances in Neural Networks - ISNN 2013, 2013

2010

Endpoint Detection of SiO₂ Plasma Etching Using Expanded Hidden Markov Model.

Sung-Ik Jeon, Seung-Gyun Kim, Sang Jeen Hong, Seung Soo Han

Proceedings of the Advances in Neural Networks, 2010

2009

A comparison and analysis of genetic algorithm and particle swarm optimization using neural network models for high efficiency solar cell fabrication processes.

Hyun-Soo Kim, Sang Jeen Hong, Seung Soo Han

Proceedings of the FUZZ-IEEE 2009, 2009

2007

Characterization and Optimization of the Contact Formation for High-Performance Silicon Solar Cells.

SungJoon Lee, A. Pandey, DongSeop Kim, Ajeet Rohatgi, Gary S. May, Sang Jeen Hong, Seung Soo Han

Proceedings of the Advances in Neural Networks, 2007

2006

Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network.

Byungwhan Kim, Sooyoun Kim, Sang Jeen Hong

Proceedings of the Advances in Neural Networks - ISNN 2006, Third International Symposium on Neural Networks, Chengdu, China, May 28, 2006

Modeling and Characterization of Plasma Processes Using Modular Neural Network.

Seung Soo Han, Dong Sun Seo, Sang Jeen Hong

Proceedings of the Advances in Neural Networks - ISNN 2006, Third International Symposium on Neural Networks, Chengdu, China, May 28, 2006

2005

Neural-Network-Based Sensor Fusion of Optical Emission and Mass Spectroscopy Data for Real-Time Fault Detection in Reactive Ion Etching.

Sang Jeen Hong, Gary S. May

IEEE Trans. Ind. Electron., 2005

Characterization of Negative Photoresist Processing by Statistical Design of Experiment (DOE).

Sei-Young Mun, Gwang-Beom Kim, Dea-Wha Soh, Sang Jeen Hong

J. Inform. and Commun. Convergence Engineering, 2005

Sensitivity Analysis of Plasma Charge-up Monitoring Sensor.

SungJoon Lee, Dea-Wha Soh, Sang Jeen Hong

J. Inform. and Commun. Convergence Engineering, 2005

Equalization of a Wireless ATM Channel with Simplified Complex Bilinear Recurrent Neural Network.

Dong-Chul Park, Duc-Hoai Nguyen, Sang Jeen Hong, Yunsik Lee

Proceedings of the Advances in Natural Computation, First International Conference, 2005