C. H. Chou

According to our database, C. H. Chou authored at least 2 papers between 2015 and 2025.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2025

Exploring AC Time-Dependent Dielectric Breakdown (TDDB) Through Frequency Noise Analysis.

Y. K. Chang, P. J. Liao, Y. C. Chang, C. H. Chou, Y. S. Liu, J. H. Lee, Ryan Lu, Y. K. Hwang

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2015

Leakage current mechanism and effect of Y₂O₃ doped with Zr high-K gate dielectrics.

K. C. Lin, P. C. Juan, C. H. Liu, Mu-Chun Wang, C. H. Chou

Microelectron. Reliab., 2015