Mu-Chun Wang

According to our database, Mu-Chun Wang authored at least 15 papers between 2001 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Analyzing and Simulating User Utterance Reformulation in Conversational Recommender Systems.

Shuo Zhang, Mu-Chun Wang, Krisztian Balog

Proceedings of the SIGIR '22: The 45th International ACM SIGIR Conference on Research and Development in Information Retrieval, Madrid, Spain, July 11, 2022

Textomics: A Dataset for Genomics Data Summary Generation.

Mu-Chun Wang, Zixuan Liu, Sheng Wang

Proceedings of the 60th Annual Meeting of the Association for Computational Linguistics (Volume 1: Long Papers), 2022

2021

RCD: Relation Map Driven Cognitive Diagnosis for Intelligent Education Systems.

Weibo Gao, Qi Liu, Zhenya Huang, Yu Yin, Haoyang Bi, Mu-Chun Wang, Jianhui Ma, Shijin Wang, Yu Su

Proceedings of the SIGIR '21: The 44th International ACM SIGIR Conference on Research and Development in Information Retrieval, 2021

2020

Fringe Gate Leakage of 28nm HK/MG nMOSFETs with Nitridation Treatments.

De-Cheng Zhang, Ching-Chuan Chou, Ho-Hsiang Chen, Shang-Ze Chen, Jian-Ming Chen, Hui-Yun Bor, Wen-How Lan, Mu-Chun Wang

Proceedings of the 3rd IEEE International Conference on Knowledge Innovation and Invention, 2020

Junction Integrity for 28nm High-k nMOSFETs with Thermal Stress.

Yu-Chen Lin, Kai-Chun Zhan, Ji-Min Zhang, Jian-Ming Chen, Cheng-Hsun-Tony Chang, Shea-Jue Wang, Mu-Chun Wang

Proceedings of the 3rd IEEE International Conference on Knowledge Innovation and Invention, 2020

Patterns of Exposing Integrity of 28nm-node High-k Gate Dielectric on p-substrate with Nitridation Treatments.

Si-Ping Li, Jia-Wei Xu, Wei-Hao Li, Jian-Ming Chen, Chao-Nan Wei, Wen-How Lan, Mu-Chun Wang

Proceedings of the 3rd IEEE International Conference on Knowledge Innovation and Invention, 2020

Q-factor Integrity of 28nm-node High-k Gate Dielectric.

Ying-Jun Deng, Hao-Lun Hu, Yu-Han Liang, Jian-Ming Chen, Ching-Chuan Chou, Shea-Jue Wang, Mu-Chun Wang

Proceedings of the 3rd IEEE International Conference on Knowledge Innovation and Invention, 2020

2018

Electrical and Physical Characteristics of WO₃/Ag/WO₃ Sandwich Structure Fabricated with Magnetic-Control Sputtering Metrology †.

Shea-Jue Wang, Mu-Chun Wang, Shih-Fan Chen, Yu-Hsiang Li, Tien-Szu Shen, Hui-Yun Bor, Chao-Nan Wei

Sensors, 2018

Thermal stress probing the channel-length modulation effect of nano n-type FinFETs.

Fu-Yuan Tuan, Chii-Wen Chen, Mu-Chun Wang, Wen-Shiang Liao, Shea-Jue Wang, Shou-Kong Fan, Wen-How Lan

Microelectron. Reliab., 2018

2015

Heat stress exposing performance of deep-nano HK/MG nMOSFETs using DPN or PDA treatment.

Shea-Jue Wang, Mu-Chun Wang, Shuang-Yuan Chen, Wen-How Lan, Bor-Wen Yang, L. S. Huang, Chuan-Hsi Liu

Microelectron. Reliab., 2015

Leakage current mechanism and effect of Y₂O₃ doped with Zr high-K gate dielectrics.

K. C. Lin, P. C. Juan, C. H. Liu, Mu-Chun Wang, C. H. Chou

Microelectron. Reliab., 2015

2010

Promoting of charged-device model/electrostatic discharge immunity in the dicing saw process.

Mu-Chun Wang, Chuan-Hsi Liu, Kuo-Shu Huang, Zhen-Ying Hsieh, Shuang-Yuan Chen, Hsin-Chia Yang, Chii-Ruey Lin

Microelectron. Reliab., 2010

2009

Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs.

Zhen-Ying Hsieh, Mu-Chun Wang, Chih Chen, Jia-Min Shieh, Yu-Ting Lin, Shuang-Yuan Chen, Heng-Sheng Huang

Microelectron. Reliab., 2009

2005

<i>iCane</i> - A Partner for the Visually Impaired.

Tsung-Hsiang Chang, Chien-Ju Ho, David Chawei Hsu, Yuan-Hsiang Lee, Min-Shieh Tsai, Mu-Chun Wang, Jane Yung-jen Hsu

Proceedings of the Embedded and Ubiquitous Computing - EUC 2005 Workshops, 2005

2001

Compact Layout Rule Extraction for Latchup Prevention in a 0.25-?m Shallow-Trench-Isolation Silicided Bulk CMOS Process.

Ming-Dou Ker, Wen-Yu Lo, Tung-Yang Chen, Howard Tang, S.-S. Chen, Mu-Chun Wang

Proceedings of the 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 2001