C. K. Yoon

According to our database, C. K. Yoon authored at least 2 papers in 2005.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2005

Dielectric reliability of stacked Al₂O₃-HfO₂ MIS capacitors with cylinder type for improving DRAM data retention characteristics.

J. Y. Seo, K. J. Lee, S. Y. Lee, S. J. Hwang, C. K. Yoon

Microelectron. Reliab., 2005

Reliability for Recessed Channel Structure n-MOSFET.

J. Y. Seo, K. J. Lee, Y. S. Kim, S. Y. Lee, S. J. Hwang, C. K. Yoon

Microelectron. Reliab., 2005