J. Y. Seo

According to our database, J. Y. Seo authored at least 3 papers between 2005 and 2010.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2010

PMOSFET anti-fuse using GIDL-induced-HEIP mechanism.

J. Y. Seo, J. E. Seok, W. S. Kim, N. H. Cha, J. S. Kang, B. S. So

Microelectron. Reliab., 2010

2005

Dielectric reliability of stacked Al₂O₃-HfO₂ MIS capacitors with cylinder type for improving DRAM data retention characteristics.

J. Y. Seo, K. J. Lee, S. Y. Lee, S. J. Hwang, C. K. Yoon

Microelectron. Reliab., 2005

Reliability for Recessed Channel Structure n-MOSFET.

J. Y. Seo, K. J. Lee, Y. S. Kim, S. Y. Lee, S. J. Hwang, C. K. Yoon

Microelectron. Reliab., 2005