Calvin Chao

Orcid: 0000-0002-1495-576X

According to our database1, Calvin Chao authored at least 10 papers between 2014 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2023
Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor.
Sensors, September, 2023

2021
Session 7 Overview: Imagers and Range Sensors Imagers, Medical, Mems and Displays Subcommittee.
Proceedings of the IEEE International Solid-State Circuits Conference, 2021

A 50K devices/sec Real-Time RTN Analysis System for Technology Benchmarking.
Proceedings of the International Conference on IC Design and Technology, 2021

2019
Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors.
Sensors, 2019

2018
A 0.66e<sub>rms</sub><sup>-</sup> Temporal-Readout-Noise 3-D-Stacked CMOS Image Sensor With Conditional Correlated Multiple Sampling Technique.
IEEE J. Solid State Circuits, 2018

A 1.1μm-Pitch 13.5Mpixel 3D-stacked CMOS image sensor featuring 230fps full-high-definition and 514fps high-definition videos by reading 2 or 3 rows simultaneously using a column-switching matrix.
Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018

2017
Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method.
Sensors, 2017

2016
6.8 A 1.5V 33Mpixel 3D-stacked CMOS image sensor with negative substrate bias.
Proceedings of the 2016 IEEE International Solid-State Circuits Conference, 2016

2015
A 0.66e<sup>-</sup>rms temporal-readout-noise 3D-stacked CMOS image sensor with conditional correlated multiple sampling (CCMS) technique.
Proceedings of the Symposium on VLSI Circuits, 2015

2014
A peripheral switchable 3D stacked CMOS image sensor.
Proceedings of the Symposium on VLSI Circuits, 2014


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