Vincent Goiffon

Orcid: 0000-0001-5024-0115

According to our database1, Vincent Goiffon authored at least 10 papers between 2015 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

Online presence:

On csauthors.net:

Bibliography

2023
Development of a Charge-Multiplication CMOS Image Sensor Based on Capacitive Trench for Low-Light-Level Imaging.
Sensors, December, 2023

Evaluation of Microlenses, Color Filters, and Polarizing Filters in CIS for Space Applications.
Sensors, July, 2023

Quantum efficiency of backside-illuminated pixels under ultraviolet illumination: ARC coatings impact measurements and simulations.
Proceedings of the Imaging Sensors and Systems 2023, 2023

2022
Automatic Detection and Correction of Random Telegraph Signal Artifacts in Earth Observation Images.
IEEE Geosci. Remote. Sens. Lett., 2022

2019
CMOS Image Sensors and Plasma Processes: How PMD Nitride Charging Acts on the Dark Current.
Sensors, 2019

Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage.
Sensors, 2019

Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors.
Sensors, 2019

Plasma Antenna Charging in CMOS Image Sensors.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
Dark Current Limiting Mechanisms in CMOS Image Sensors.
Proceedings of the Image Sensors and Imaging Systems 2018, 2018

2015
Charge transfer speed analysis in pinned photodiode CMOS image sensors based on a pulsed storage-gate method.
Proceedings of the 45th European Solid State Device Research Conference, 2015


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