Carsten Wegener

According to our database, Carsten Wegener authored at least 17 papers between 2000 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

Guest Editorial: Analog, Mixed-Signal and RF Testing.

Gildas Léger, Carsten Wegener

J. Electron. Test., 2016

2013

Method of modeling analog circuits in verilog for mixed-signal design simulations.

Carsten Wegener

Proceedings of the 21st European Conference on Circuit Theory and Design, 2013

2010

Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A/D Converter INL Testing With a Low-Quality Sine Wave Stimulus.

Esa Korhonen, Carsten Wegener, Juha Kostamovaara

IEEE Trans. Circuits Syst. I Regul. Pap., 2010

2009

Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores.

Carsten Wegener, Heinz Mattes, Stéphane Kirmser, Frank Demmerle, Sebastian Sattler

J. Electron. Test., 2009

An approach to linear model-based testing for nonlinear cascaded mixed-signal systems.

Reik Müller, Carsten Wegener, Hans-Joachim Jentschel, Sebastian Sattler, Heinz Mattes

Proceedings of the Design, Automation and Test in Europe, 2009

2007

Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing.

Carsten Wegener, Michael Peter Kennedy

J. Electron. Test., 2007

2006

Test Development Through Defect and Test Escape Level Estimation for Data Converters.

Carsten Wegener, Michael Peter Kennedy

J. Electron. Test., 2006

2005

Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs.

Carsten Wegener, Michael Peter Kennedy

J. Electron. Test., 2005

Innovation to overcome limitations of test equipment.

Carsten Wegener, Michael Peter Kennedy

Proceedings of the 2005 European Conference on Circuit Theory and Design, 2005

2004

Linear model-based testing of ADC nonlinearities.

Carsten Wegener, Michael Peter Kennedy

IEEE Trans. Circuits Syst. I Regul. Pap., 2004

Testing ADCs for static and dynamic INL - killing two birds with one stone.

Carsten Wegener, Michael Peter Kennedy

Comput. Stand. Interfaces, 2004

2003

Method of reducing contactor effect when testing high-precision ADCs.

Gwenolé Maugard, Carsten Wegener, Tom O'Dwyer, Michael Peter Kennedy

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Linear Model-Based Error Identification and Calibration for Data Converters.

Carsten Wegener, Michael Peter Kennedy

Proceedings of the 2003 Design, 2003

2002

Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs.

Carsten Wegener, Michael Peter Kennedy

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits.

Carsten Wegener, Michael Peter Kennedy, Bernd Straube

J. Electron. Test., 2001

2000

Model-based testing of high-resolution ADCs.

Carsten Wegener, Michael Peter Kennedy

Proceedings of the IEEE International Symposium on Circuits and Systems, 2000

Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs.

Carsten Wegener, Michael Peter Kennedy

Proceedings of the 2000 Design, 2000