Charles S. Whitman

According to our database, Charles S. Whitman authored at least 13 papers between 2003 and 2017.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2017

Determination of safe reliability region over temperature and current density for through wafer vias.

Charles S. Whitman, Michael G. Meeder, Peter J. Zampardi

Microelectron. Reliab., 2017

2014

Methodology for predicting off-state reliability in GaN power transistors.

Charles S. Whitman

Microelectron. Reliab., 2014

2012

Impact of ambient temperature set point deviation on Arrhenius estimates.

Charles S. Whitman

Microelectron. Reliab., 2012

2009

Prediction of transmission line lifetimes over temperature and current density.

Charles S. Whitman

Microelectron. Reliab., 2009

2008

Estimating effective dielectric thickness for capacitors with extrinsic defects by a statistical method.

Charles S. Whitman

Microelectron. Reliab., 2008

Acceleration factors for THB induced degradation of AlGaAs/InGaAs pHEMT devices.

Leslie Marchut, Charles S. Whitman

Microelectron. Reliab., 2008

2007

Defining the safe operating area for HBTs with an InGaP emitter across temperature and current density.

Charles S. Whitman

Microelectron. Reliab., 2007

2006

Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237].

Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell

Microelectron. Reliab., 2006

Determining factors affecting ESD failure voltage using DOE.

Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell

Microelectron. Reliab., 2006

Erratum to "Reliability results of HBTs with an InGaP emitter" [Microelectron. Reliability 46 (2006) 1261-1271].

Charles S. Whitman

Microelectron. Reliab., 2006

Reliability results of HBTs with an InGaP emitter.

Charles S. Whitman

Microelectron. Reliab., 2006

2005

Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method.

Charles S. Whitman, Michael Meeder

Microelectron. Reliab., 2005

2003

Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares.

Charles S. Whitman

Microelectron. Reliab., 2003