Chen-Chien Li
  According to our database1,
  Chen-Chien Li
  authored at least 2 papers
  between 2015 and 2017.
  
  
Collaborative distances:
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Bibliography
  2017
Improved reliability characteristics of Ge MOS devices by capping Hf or Zr on interfacial layer.
    
  
    Microelectron. Reliab., 2017
    
  
  2015
Gate leakage current suppression and reliability improvement for ultra-low EOT Ge MOS devices by suitable HfAlO/HfON thickness and sintering temperature.
    
  
    Microelectron. Reliab., 2015