Christian Petit

According to our database1, Christian Petit authored at least 5 papers between 2001 and 2007.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

2007
Stress induced gate-drain leakage current in ultra-thin gate oxide.
Microelectron. Reliab., 2007

Low voltage stress induced leakage current and time to breakdown in ultra-thin (1.2-2.3nm) oxides.
Microelectron. Reliab., 2007

2005
Low voltage SILC and P- and N-MOSFET gate oxide reliability.
Microelectron. Reliab., 2005

2003
Contribution of oxide traps on defect creation and LVSILC conduction in ultra thin gate oxide devices.
Microelectron. Reliab., 2003

2001
High field stress at and above room temperature in 2.3 nm thick oxides.
Microelectron. Reliab., 2001


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