M. Fadlallah

According to our database1, M. Fadlallah authored at least 13 papers between 2000 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2018
Snow Depth Retrieval Algorithm from Radar Backscattering Measurements at L- and X- Band Using Multi-Incidence Angles.
Proceedings of the 2018 International Conference on High Performance Computing & Simulation, 2018

Oil Thickness Estimation Using Single- and Dual- Frequency Maximum-Likelihood Approach.
Proceedings of the 2018 International Conference on High Performance Computing & Simulation, 2018

2017
Sampled Antenna Array Digital Beamforming for LTE-Advanced.
Proceedings of the 2017 International Conference on High Performance Computing & Simulation, 2017

Multi-Frequency Approach for Oil Spill Remote Sensing Detection.
Proceedings of the 2017 International Conference on High Performance Computing & Simulation, 2017

2014
Practical design for circularly polarized dual off-center aperture-coupled microstrip antenna for GPS application.
Proceedings of the International Conference on High Performance Computing & Simulation, 2014

2013
Design of MSRR-loaded dual-band dipole PCB antennas.
Proceedings of the 20st International Conference on Telecommunications, 2013

MSRR metamaterial-based antenna system for MIMO applications.
Proceedings of the Third International Conference on Communications and Information Technology, 2013

2012
Performances of low profile dipole antenna AMC-based surface using metamaterials structures.
Proceedings of the 19th International Conference on Telecommunications, 2012

2005
Low voltage SILC and P- and N-MOSFET gate oxide reliability.
Microelectron. Reliab., 2005

2003
Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices.
Microelectron. Reliab., 2003

2002
Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs.
Microelectron. Reliab., 2002

2001
Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta<sub>2</sub>O<sub>5</sub> as gate dielectrics.
Microelectron. Reliab., 2001

2000
Numerical simulation and modeling of static characteristics and electrical noise in submicron MOS transistors.
Proceedings of the 2000 7th IEEE International Conference on Electronics, 2000


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