Chryssa Dislis

According to our database, Chryssa Dislis authored at least 16 papers between 1989 and 2002.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2002

Improving Service Availability via Low-Outage Upgrades.

Chryssa Dislis

Proceedings of the 26th International Computer Software and Applications Conference (COMPSAC 2002), 2002

2001

Incorporating Software Reliability Engineering into the Test Process for an Extensive GUI-Based Network Management System.

Deirdre Donovan, Chryssa Dislis, Ray Murphy, Stephen Unger, Christina Kenneally, Janet Young, Liz Sheehan

Proceedings of the 12th International Symposium on Software Reliability Engineering (ISSRE 2001), 2001

1999

The evolution of a system test process [for Motorola GSM products].

Simon Martin, Robert Bleck, Chryssa Dislis, Des Farren

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Test process optimization: closing the gap in the defect spectrum.

Norma Barrett, Simon Martin, Chryssa Dislis

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Clinical potential and design of programmable mechanical impedances for orthotic applications.

William S. Harwin, Lee O. Leiber, Gregory P. G. Austwick, Chryssa Dislis

Robotica, 1998

Guest Editors' Introduction: Early Modeling and Analysis of Packaged Systems.

David E. Schimmel, Chryssa Dislis

IEEE Des. Test Comput., 1998

Formal Design Techniques - Theory and Engineering Reality.

Chryssa Dislis, Gerry Musgrave, Roger B. Hughes

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1996

Economics Modelling and Optimisation of MCM Test Strategies.

Chryssa Dislis, Ian P. Jalowiecki

Proceedings of the 1996 European Design and Test Conference, 1996

1995

MCM Quality and Cost Analysis Using Economics Models.

Chryssa Dislis, A. F. Al-Ani, Ian P. Jalowiecki

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Sensitivity analysis in economics based test strategy planning.

J. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler

J. Electron. Test., 1994

Test strategy planning using economic analysis.

I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick

J. Electron. Test., 1994

1993

Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards.

Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Algorithms for Cost Optimised Test Strategy Selection.

Chryssa Dislis, J. H. Dick, Anthony P. Ambler

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Economics in Design and Test.

Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick

Proceedings of the Proceedings 1993 International Conference on Computer Design: VLSI in Computers & Processors, 1993

1991

Economic Effects in Design and Test.

I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick

IEEE Des. Test Comput., 1991

1989

Cost Analysis of Test Method Environments.

Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler

Proceedings of the Proceedings International Test Conference 1989, 1989