Chuangwei Li

According to our database, Chuangwei Li authored at least 2 papers between 2015 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Microcontroller susceptibility variations to EFT burst during accelerated aging.

Jianfei Wu, Chuangwei Li, Binhong Li, Wei Zhu, Hongyi Wang

Microelectron. Reliab., 2016

2015

Investigation on the immunity of microcontroller to electrical fast transients.

Chuangwei Li, Jiancheng Li, Jianfei Wu, Yu Xiao

Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015