Binhong Li

Orcid: 0009-0007-3821-7984

According to our database1, Binhong Li authored at least 25 papers between 2004 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2024
Using Fuzzy C-Means Clustering to Determine First Arrival of Microseismic Recordings.
Sensors, March, 2024

A two-stage slicer employing body biasing for 64-Gb/s PAM4 wireline receiver in 22-nm FDSOI technology.
Microelectron. J., 2024

2023
T-Topology Coupler-Based Bandpass Negative Group Delay Active Circuit Design and Test.
IEEE Des. Test, April, 2023

A Portfolio Selection Strategy Based on the Peak Price Involving Randomness.
IEEE Access, 2023

Anole: A Lightweight and Verifiable Learned-Based Index for Time Range Query on Blockchain Systems.
Proceedings of the Database Systems for Advanced Applications, 2023

2022
Design and Experimentation of Inductorless Low-Pass NGD Integrated Circuit in 180-nm CMOS Technology.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2021
Examining the Thermal Stress Effect of Electromagnetic Susceptibility of Automotive CAN Controller.
J. Circuits Syst. Comput., 2021

2020
Analytical Design of Dual-Band Negative Group Delay Circuit With Multi-Coupled Lines.
IEEE Access, 2020

S-Matrix and Bandpass Negative Group Delay Innovative Theory of Ti-Geometrical Shape Microstrip Structure.
IEEE Access, 2020

2019
Time-Domain Experimentation of NGD ActiveRC-Network Cell.
IEEE Trans. Circuits Syst. II Express Briefs, 2019

Negative Group Delay Theory of a Four-Port RC-Network Feedback Operational Amplifier.
IEEE Access, 2019

2018
Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory.
Microelectron. Reliab., 2018

The total ionizing dose response of leading-edge FDSOI MOSFETs.
Microelectron. Reliab., 2018

Process variation dependence of total ionizing dose effects in bulk nFinFETs.
Microelectron. Reliab., 2018

Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment.
Microelectron. Reliab., 2018

The Design Method of the Active Negative Group Delay Circuits Based on a Microwave Amplifier and an RL-Series Network.
IEEE Access, 2018

2017
Investigations on the EFT immunity of microcontrollers with different architectures.
Microelectron. Reliab., 2017

2016
Microcontroller susceptibility variations to EFT burst during accelerated aging.
Microelectron. Reliab., 2016

Electromagnetic susceptibility characterization of double SOI device.
Microelectron. Reliab., 2016

2012
Prediction of Long-term Immunity of a Phase-Locked Loop.
J. Electron. Test., 2012

2011
Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences.
Microelectron. Reliab., 2011

Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout.
Microelectron. Reliab., 2011

2010
Ageing effect on electromagnetic susceptibility of a phase locked loop.
Microelectron. Reliab., 2010

2004
The scattering fields of 2-D sea fractal surface with finite conductivity illuminated by ellipse polarization wave. Part One. Scattering fields in Cartesian coordinates.
Proceedings of the 2004 IEEE International Geoscience and Remote Sensing Symposium, 2004

The scattering fields of 2-D sea fractal surface with finite conductivity illuminated by ellipse polarization wave. Part two. Scattering matrix and numerical results.
Proceedings of the 2004 IEEE International Geoscience and Remote Sensing Symposium, 2004


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