Binhong Li

According to our database, Binhong Li authored at least 24 papers between 2004 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Using Fuzzy C-Means Clustering to Determine First Arrival of Microseismic Recordings.

Xiangyun Zhao, Haihang Chen, Binhong Li, Zhen Yang, Huailiang Li

Sensors, March, 2024

2023

T-Topology Coupler-Based Bandpass Negative Group Delay Active Circuit Design and Test.

Taochen Gu, Fayu Wan, Jingjie Zhou, Qizheng Ji, Binhong Li, Blaise Ravelo

IEEE Des. Test, April, 2023

A Portfolio Selection Strategy Based on the Peak Price Involving Randomness.

Binhong Li, Jiaxi Luo, Hongjie Xu

IEEE Access, 2023

Anole: A Lightweight and Verifiable Learned-Based Index for Time Range Query on Blockchain Systems.

Jian Chang, Binhong Li, Jiang Xiao, Licheng Lin, Hai Jin

Proceedings of the Database Systems for Advanced Applications, 2023

2022

Design and Experimentation of Inductorless Low-Pass NGD Integrated Circuit in 180-nm CMOS Technology.

Fayu Wan, Taochen Gu, Binhong Li, Bo Li, Wenceslas Rahajandraibe, Mathieu Guerin, Sébastien Lalléchère, Blaise Ravelo

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2021

Examining the Thermal Stress Effect of Electromagnetic Susceptibility of Automotive CAN Controller.

Jianfei Wu, Xiangqian Li, Binhong Li, Yong Xie, Mengjun Wang

J. Circuits Syst. Comput., 2021

2020

Analytical Design of Dual-Band Negative Group Delay Circuit With Multi-Coupled Lines.

Xiang Zhou, Binhong Li, Ningdong Li, Blaise Ravelo, Xiaofeng Hu, Qizheng Ji, Fayu Wan, Glauco Fontgalland

IEEE Access, 2020

S-Matrix and Bandpass Negative Group Delay Innovative Theory of Ti-Geometrical Shape Microstrip Structure.

Xiang Zhou, Taochen Gu, Lili Wu, Fayu Wan, Binhong Li, Nour Mohammad Murad, Sébastien Lalléchère, Blaise Ravelo

IEEE Access, 2020

2019

Time-Domain Experimentation of NGD ActiveRC-Network Cell.

Fayu Wan, Ningdong Li, Blaise Ravelo, Junxiang Ge, Binhong Li

IEEE Trans. Circuits Syst. II Express Briefs, 2019

Negative Group Delay Theory of a Four-Port RC-Network Feedback Operational Amplifier.

Fayu Wan, Taocheng Gu, Blaise Ravelo, Binhong Li, Jing Cheng, Qingyun Yuan, Junxiang Ge

IEEE Access, 2019

2018

Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory.

Jianfei Wu, Wei Zhu, Binhong Li, Yafei Li, Hongyi Wang, Mengjun Wang

Microelectron. Reliab., 2018

The total ionizing dose response of leading-edge FDSOI MOSFETs.

Jian Wang, Binhong Li, Yang Huang, Kai Zhao, Fang Yu, Qiwen Zheng, Qi Guo, Liewei Xu, J. Gao, X. Cai, Y. Cui

Microelectron. Reliab., 2018

Process variation dependence of total ionizing dose effects in bulk nFinFETs.

Bo Li, Yunbo Huang, Ling Yang, Qingzhu Zhang, Zhongshan Zheng, Binhong Li, Huiping Zhu, Jianhui Bu, Huaxiang Yin, Jiajun Luo, Zhengsheng Han, Haibin Wang

Microelectron. Reliab., 2018

Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment.

Binhong Li, Yang Huang, Jianfei Wu, Yunbo Huang, Bo Li, Qingzhu Zhang, Ling Yang, Fayu Wan, Jiajun Luo, Zhengsheng Han, Huaxiang Yin

Microelectron. Reliab., 2018

The Design Method of the Active Negative Group Delay Circuits Based on a Microwave Amplifier and an RL-Series Network.

Fayu Wan, Ningdong Li, Blaise Ravelo, Qizheng Ji, Binhong Li, Junxiang Ge

IEEE Access, 2018

2017

Investigations on the EFT immunity of microcontrollers with different architectures.

Jianfei Wu, Binhong Li, W. Zhu, H. Wang, L. Zheng

Microelectron. Reliab., 2017

2016

Microcontroller susceptibility variations to EFT burst during accelerated aging.

Jianfei Wu, Chuangwei Li, Binhong Li, Wei Zhu, Hongyi Wang

Microelectron. Reliab., 2016

Electromagnetic susceptibility characterization of double SOI device.

Binhong Li, Kai Zhao, Jianfei Wu, Xing Zhao, Jianwei Su, Jiantou Gao, Chuang Gao, Jun Luo

Microelectron. Reliab., 2016

2012

Prediction of Long-term Immunity of a Phase-Locked Loop.

Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon

J. Electron. Test., 2012

2011

Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences.

Binhong Li, Néstor Berbel, Alexandre Boyer, Sonia Bendhia, Raúl Fernández-García

Microelectron. Reliab., 2011

Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout.

Néstor Berbel, Raúl Fernández-García, Ignacio Gil, Binhong Li, Alexandre Boyer, Sonia Bendhia

Microelectron. Reliab., 2011

2010

Ageing effect on electromagnetic susceptibility of a phase locked loop.

Binhong Li, Alexandre Boyer, Sonia Bendhia, Christophe Lemoine

Microelectron. Reliab., 2010

2004

The scattering fields of 2-D sea fractal surface with finite conductivity illuminated by ellipse polarization wave. Part One. Scattering fields in Cartesian coordinates.

Xie Tao, Binhong Li, Wenjun Chen, Yijun He

Proceedings of the 2004 IEEE International Geoscience and Remote Sensing Symposium, 2004

The scattering fields of 2-D sea fractal surface with finite conductivity illuminated by ellipse polarization wave. Part two. Scattering matrix and numerical results.

Xie Tao, Yijun He, Binhong Li, Wenjun Chen

Proceedings of the 2004 IEEE International Geoscience and Remote Sensing Symposium, 2004