Chung-Huang Yeh

According to our database, Chung-Huang Yeh authored at least 6 papers between 2019 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Prediction of the Test Yield of Future Integrated Circuits Through the Deductive Estimation Method.

Chung-Huang Yeh, Jwu E. Chen

J. Circuits Syst. Comput., August, 2023

Recycling Test Methods to Improve Test Capacity and Increase Chip Shipments.

Chung-Huang Yeh, Jwu E. Chen

IEEE Des. Test, June, 2023

Multiple Retest Systems for Screening High-Quality Chips.

Chung-Huang Yeh, Jwu E. Chen

J. Electron. Test., April, 2023

2022

Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect.

Chung-Huang Yeh, Jwu E. Chen

Sensors, 2022

2020

The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing.

Chung-Huang Yeh, Jwu E. Chen

Proceedings of the IEEE International Test Conference in Asia, 2020

2019

Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product Requirements.

Chung-Huang Yeh, Jwu E. Chen

J. Electron. Test., 2019