Clement Huang

According to our database, Clement Huang authored at least 2 papers between 2020 and 2025.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2025

Comprehensive Study of Non-Conducting Stress Characteristics in Ultra-Scaled FinFET.

Jun-Yu Huang, Clement Huang, Kun-Chung Huang, Da-You Yang, Hsin-Jou Chuang, Yi-Wen Lee, Eliot Chen, Jen-Hao Lee, Ryan Lu

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2020

Stress Induced Voiding Behavior of Electroplated Copper Thin Films in Highly Scaled Cu/low-k interconnects.

Clement Huang, Alex Juan, K. C. Su

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020