Corinna Kofler

Orcid: 0000-0003-4056-2617

According to our database1, Corinna Kofler authored at least 6 papers between 2017 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2025
Towards Explaining SEM Defect Image Classification.
Proceedings of the ECAI 2025 - 28th European Conference on Artificial Intelligence, 25-30 October 2025, Bologna, Italy, 2025

2022
Detection of Unknown Defects in Semiconductor Materials from a Hybrid Deep and Machine Learning Approach.
Proceedings of the Bio-inspired Systems and Applications: from Robotics to Ambient Intelligence, 2022

Data-Centric Model Development to Improve the CNN Classification of Defect Density SEM Images.
Proceedings of the IECON 2022, 2022

2019
Classifying Image Stacks of Specular Silicon Wafer Back Surface Regions: Performance Comparison of CNNs and SVMs.
Sensors, 2019

2018
Detecting Star Cracks in Topography Images of Specular Back Surfaces of Structured Wafers.
Proceedings of the 17th IEEE International Conference on Machine Learning and Applications, 2018

2017
Classifying defects in topography images of silicon wafers.
Proceedings of the 2017 Winter Simulation Conference, 2017


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