D. Faure

According to our database, D. Faure authored at least 4 papers between 2002 and 2005.

Collaborative distances:

• no known Dijkstra number.
• no known Erdős number.

2005

SRAM cell defect isolation methodology by sub micron probing technique.

F. Sibileau, C. Ali, C. Giret, D. Faure

Microelectron. Reliab., 2005

2003

Gate oxide breakdown characterization on 0.13mum CMOS technology.

D. Faure, D. Bru, C. Ali, C. Giret, K. Christensen

Microelectron. Reliab., 2003

2002

Electrical characteristics measurement of transistors by 4 tips-0.2 micron probing technique in Semiconductor Failure Analysis.

C. Giret, D. Bru, D. Faure, C. Ali, M. Razani, D. Gobled

Microelectron. Reliab., 2002

A New sub-micro probing technique for failure analysis in integrated circuits.

D. Faure, C. A. Waggoner

Microelectron. Reliab., 2002