D. Gobled

According to our database, D. Gobled authored at least 1 paper in 2002.

Collaborative distances:

• no known Dijkstra number.
• no known Erdős number.

2002

Electrical characteristics measurement of transistors by 4 tips-0.2 micron probing technique in Semiconductor Failure Analysis.

C. Giret, D. Bru, D. Faure, C. Ali, M. Razani, D. Gobled

Microelectron. Reliab., 2002