D. Lachenal

According to our database1, D. Lachenal authored at least 2 papers between 2005 and 2007.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2007
Degradation mechanism understanding of NLDEMOS SOI in RF applications.
Microelectron. Reliab., 2007

2005
Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology.
Microelectron. Reliab., 2005


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