Dahye Min

According to our database1, Dahye Min authored at least 2 papers between 2018 and 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2019
SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit.
Proceedings of the IEEE International Reliability Physics Symposium, 2018


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