Daozheng Wei

According to our database, Daozheng Wei authored at least 7 papers between 1986 and 1996.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

1996

Accelerated techniques in stem fault simulation.

Yin Shi, Daozheng Wei

J. Comput. Sci. Technol., 1996

1994

GLOBAL: A design for random testability algorithm.

Dong Xiang, Daozheng Wei

J. Comput. Sci. Technol., 1994

An Optimal Design for Parallel Test Generation Based on Circuit Partitioning.

Dong Xiang, Daozheng Wei

Proceedings of the Seventh International Conference on VLSI Design, 1994

1993

Deductive fault simulation algorithm based on fault collapsing.

Yunzhan Gong, Daozheng Wei

J. Comput. Sci. Technol., 1993

DLJ: A dynamic line-justification algorithm for test generation.

Qingfang Chen, Daozheng Wei

J. Comput. Sci. Technol., 1993

1992

A Global Test Point Placement Algorithm of Combinational Circuits.

Dong Xiang, Daozheng Wei, Shisong Chen

Proceedings of the Fifth International Conference on VLSI Design, 1992

1986

A New Testability Measure for Digital Circuits.

Jian-Cao Wang, Daozheng Wei

Proceedings of the Proceedings International Test Conference 1986, 1986