Dieu Van Dinh

According to our database, Dieu Van Dinh authored at least 3 papers between 2000 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2021

A Design Approach to Reduce Test Time on SOC Memories.

Prokash Ghosh, Dieu Van Dinh, Misal Varma

Proceedings of the 34th IEEE International System-on-Chip Conference, 2021

2005

Meeting the Test Challenges of the 1 Gbps Parallel RapidIO Interface with New Automatic Test Equipment Capabilities.

Darren Aaberge, Ken Mockler, Dieu Van Dinh, Raoul Belleau, Tim Donovan, Reid Hewlitt

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

2000

An approach to testing 200 ps echo clock to output timing on the double data rate synchronous memory.

Dieu Van Dinh, Virginia Rabitoy

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000