Diganta Das

According to our database, Diganta Das authored at least 20 papers between 1996 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

One-fault-shot learning for fault severity estimation of gears that addresses differences between simulation and experimental signals and transfer function effects.

Omri Matania, Lior Bachar, Varun Khemani, Diganta Das, Michael H. Azarian, Jacob Bortman

Adv. Eng. Informatics, April, 2023

2021

Nonparametric Model-Based Online Junction Temperature and State-of-Health Estimation for Insulated Gate Bipolar Transistors.

Xiangxiang Liu, Tianlei Jiao, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht

IEEE Access, 2021

An Assessment of Validity of the Bathtub Model Hazard Rate Trends in Electronics.

Aishwarya Gaonkar, Rajkumar B. Patil, San Kyeong, Diganta Das, Michael G. Pecht

IEEE Access, 2021

2020

Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor.

Xiangxiang Liu, Lingling Li, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht

IEEE Access, 2020

2019

ACA Curing Process Optimization Based on Curing Degree Considering Shear Strength of Joints.

Guanghua Wu, Meixian Jiang, Diganta Das, Michael G. Pecht

IEEE Access, 2019

Breaking the Trust: How Companies Are Failing Their Customers.

Lidia Al-Zogbi, Diganta Das, Peter Rundle, Michael G. Pecht

IEEE Access, 2019

Evaluating Impact of Information Uncertainties on Component Reliability Assessment.

Diganta Das, Edmond Elburn, Michael G. Pecht, Bhanu Sood

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs).

Nga Man Li, Subramani Manoharan, Diganta Das, F. Patrick McCluskey

Microelectron. Reliab., 2018

2016

Thermal reliability prediction and analysis for high-density electronic systems based on the Markov process.

Yi Wan, Hailong Huang, Diganta Das, Michael G. Pecht

Microelectron. Reliab., 2016

2015

Anomaly detection for IGBTs using Mahalanobis distance.

Nishad Patil, Diganta Das, Michael G. Pecht

Microelectron. Reliab., 2015

2014

Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based Metric Test.

Moon-Hwan Chang, Chaochao Chen, Diganta Das, Michael G. Pecht

IEEE Trans. Ind. Informatics, 2014

2013

Long term storage reliability of antifuse field programmable gate arrays.

Nishad Patil, Diganta Das, Estelle Scanff, Michael G. Pecht

Microelectron. Reliab., 2013

2012

A prognostic approach for non-punch through and field stop IGBTs.

Nishad Patil, Diganta Das, Michael G. Pecht

Microelectron. Reliab., 2012

Light emitting diodes reliability review.

Moon-Hwan Chang, Diganta Das, Prabhakar V. Varde, Michael G. Pecht

Microelectron. Reliab., 2012

2011

Using Failure Modes, Mechanisms, and Effects Analysis in Medical Device Adverse Event Investigations.

Shunfeng Cheng, Diganta Das, Michael G. Pecht

Proceedings of the 2nd International Conference on Biomedical Ontology, 2011

Prognostics-based health management for telecom equipment under free air cooling.

Jun Dai, Diganta Das, Michael G. Pecht

Proceedings of EUROCON 2011, 2011

2010

Mahalanobis Distance Approach for Insulated Gate Bipolar Transistors Diagnostics.

Nishad Patil, Diganta Das, Michael G. Pecht

Proceedings of the New World Situation: New Directions in Concurrent Engineering, 2010

2009

Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics.

Nishad Patil, Jose Celaya, Diganta Das, Kai Goebel, Michael G. Pecht

IEEE Trans. Reliab., 2009

2002

The IEEE standards on reliability program and reliability prediction methods for electronic equipment.

Michael G. Pecht, Diganta Das, Arun Ramakrishnan

Microelectron. Reliab., 2002

1996

Generating redesign suggestions to reduce setup cost: a step towards automated redesign.

Diganta Das, Satyandra K. Gupta, Dana S. Nau

Comput. Aided Des., 1996