Peter Sandborn

According to our database, Peter Sandborn authored at least 25 papers between 1994 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Demonstration of a Response Time Based Remaining Useful Life (RUL) Prediction for Software Systems.

Ray Islam, Peter Sandborn

CoRR, 2023

2022

System Sustainment - Acquisition and Engineering Processes for the Sustainment of Critical and Legacy Systems

Peter Sandborn, William Lucyshyn

World Scientific Series on Emerging Technologies 4, WorldScientific, ISBN: 9789811256868, 2022

2015

The Forecasting and Impact of the Loss of Critical Human Skills Necessary for Supporting Legacy Systems.

Peter A. Sandborn, Varun J. Prabhakar

IEEE Trans. Engineering Management, 2015

Assessing the value of a lead-free solder control plan using cost-based FMEA.

Edwin Lillie, Peter Sandborn, David Humphrey

Microelectron. Reliab., 2015

A return on investment analysis of applying health monitoring to LED lighting systems.

Moon-Hwan Chang, Peter Sandborn, Michael G. Pecht, Winco K. C. Yung, Wenbin Wang

Microelectron. Reliab., 2015

PHM based predictive maintenance optimization for offshore wind farms.

Xin Lei, Peter Sandborn, Roozbeh Bakhshi, Amir Kashani-Pour, Navid Goudarzi

Proceedings of the 2015 IEEE Conference on Prognostics and Health Management, 2015

2013

Ontology-Based Knowledge Representation for Obsolescence Forecasting.

Liyu Zheng, Raymond Nelson, Janis P. Terpenny, Peter Sandborn

J. Comput. Inf. Sci. Eng., 2013

2012

An Options Approach for Decision Support of Systems With Prognostic Capabilities.

Gilbert Haddad, Peter A. Sandborn, Michael G. Pecht

IEEE Trans. Reliab., 2012

A part total cost of ownership model for long life cycle electronic systems.

Varun J. Prabhakar, Peter Sandborn

Int. J. Comput. Integr. Manuf., 2012

2011

Forecasting electronic part procurement lifetimes to enable the management of DMSMS obsolescence.

Peter Sandborn, Varun J. Prabhakar, O. Ahmad

Microelectron. Reliab., 2011

2009

A Methodology for Determining the Return on Investment Associated With Prognostics and Health Management.

Kiri Feldman, Taoufik Jazouli, Peter Sandborn

IEEE Trans. Reliab., 2009

2007

Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics.

E. Scanff, K. L. Feldman, S. Ghelam, Peter Sandborn, M. Glade, B. Foucher

Microelectron. Reliab., 2007

A maintenance planning and business case development model for the application of prognostics and health management (PHM) to electronic systems.

Peter A. Sandborn, Chris Wilkinson

Microelectron. Reliab., 2007

Introduction to special section on electronic systems prognostics and health management.

Peter Sandborn, Michael G. Pecht

Microelectron. Reliab., 2007

2006

Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly.

Zhen Shi, Peter Sandborn

J. Electron. Test., 2006

2005

A warranty forecasting model based on piecewise statistical distributions and stochastic simulation.

Andre Kleyner, Peter Sandborn

Reliab. Eng. Syst. Saf., 2005

2003

Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms.

Zhen Shi, Peter Sandborn

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

A detailed cost model for concurrent use with hardware/software co-design.

Daniel Ragan, Peter Sandborn, Paul Stoaks

Proceedings of the 39th Design Automation Conference, 2002

2001

Process capability indices and product reliability.

Bharatwaj Ramakrishnan, Peter Sandborn, Michael G. Pecht

Microelectron. Reliab., 2001

A new test/diagnosis/rework model for use in technical cost modeling of electronic systems assembly.

Thiagarajan Trichy, Peter Sandborn, Ravi Raghavan, Shubhada Sahasrabudhe

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1998

Analyzing Packaging Trade-Offs During System Design.

Peter Sandborn, Mike Vertal

IEEE Des. Test Comput., 1998

1997

Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die.

Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn

J. Electron. Test., 1997

1994

Multichip systems trade-off analysis tool.

Peter Sandborn, Rajarshi Ghosh, Ken Drake, Magdy S. Abadir, Linda Bal, Ashish Parikh

J. Electron. Test., 1994

High Level Test Economics Advisor (Hi-TEA).

Magdy S. Abadir, Ashish Parikh, Linda Bal, Peter Sandborn, Cynthia F. Murphy

J. Electron. Test., 1994

Analyzing Multichip Module Testing Strategies.

Magdy S. Abadir, Ashish R. Parikh, Linda Bal, Peter Sandborn, Ken Drake

IEEE Des. Test Comput., 1994