Duo-Yao Kang

According to our database, Duo-Yao Kang authored at least 2 papers in 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks.

Yan-Fu Chen, Duo-Yao Kang, Kuen-Jong Lee

Proceedings of the IEEE International Test Conference, 2022

Diagnosing Transition Delay Faults under Scan-Based Logic Array.

Duo-Yao Kang, Shiou-Ning Lin, Kuen-Jong Lee

Proceedings of the IEEE International Test Conference in Asia, 2022