E. Nowak

According to our database, E. Nowak authored at least 5 papers between 2018 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited).

William Vandendaele, Camille Leurquin, R. Lavieville, Marie-Anne Jaud, Abygaël Viey, Romain Gwoziecki, B. Mohamad, E. Nowak, A. Constant, Ferdinando Iucolano

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Specificities of linear Si QD arrays integration and characterization.

Heimanu Niebojewski, Benoit Bertrand, E. Nowak, Thomas Bedecarrats, Bruna Cardoso Paz, Lauriane Contamin, Pierre-André Mortemousque, V. Labracherie, L. Brevard, H. Sahin, Jean Charbonnier, C. Thomas, Myriam Assous, Mikaël Cassé, Matias Urdampilleta, Yann-Michel Niquet, François Perruchot, Fred Gaillard, Silvano De Franceschi, Tristan Meunier, Maud Vinet

Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

2021

Ge-Se-Sb-N-based OTS scaling perspectives for high-density 1 S1R crossbar arrays.

Joel Minguet Lopez, Niccolo Castellani, Laurent Grenouillet, Lucas Reganaz, Gabriele Navarro, Mathieu Bernard, Catherine Carabasse, Thomas Magis, Damien Deleruyelle, Marc Bocquet, Jean-Michel Portal, E. Nowak, Gabriel Molas

Proceedings of the IEEE International Memory Workshop, 2021

16kbit 1T1R OxRAM arrays embedded in 28nm FDSOI technology demonstrating low BER, high endurance, and compatibility with core logic transistors.

Laurent Grenouillet, Niccolo Castellani, Alain Persico, Valentina Meli, S. Martin, Olivier Billoint, R. Segaud, Stefania Bernasconi, C. Pellissier, Carine Jahan, Christelle Charpin-Nicolle, P. Dezest, Catherine Carabasse, Paul Besombes, S. Ricavy, N. P. Tran, A. Magalhaes-Lucas, A. Roman, C. Boixaderas, Thomas Magis, Messaoud Bedjaoui, M. Tessaire, A. Seignard, F. Mazen, S. Landis, Elisa Vianello, Gabriel Molas, Fred Gaillard, Julien Arcamone, E. Nowak

Proceedings of the IEEE International Memory Workshop, 2021

2018

RTN and LFN Noise Performance in Advanced FDSOI Technology.

Luca Pirro, Olaf Zimmerhackl, Alban Zaka, Lars Müller-Meskamp, Ranjith Nelluri, Tom Hermann, Ignasi Cortes-Mayol, Andreas Huschka, Michael Otto, E. Nowak, Anurag Mittal, Jan Hoentschel

Proceedings of the 48th European Solid-State Device Research Conference, 2018