Jan Hoentschel

According to our database1, Jan Hoentschel authored at least 7 papers between 2009 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2022
Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

22FDSOI device towards RF and mmWave applications.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021

2019
Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

22FDX<sup>®</sup> fMAX Optimization through Parasitics Reduction and GM Boost.
Proceedings of the 49th European Solid-State Device Research Conference, 2019

2018
RTN and LFN Noise Performance in Advanced FDSOI Technology.
Proceedings of the 48th European Solid-State Device Research Conference, 2018

2009
Advanced SOI CMOS transistor technologies for high-performance microprocessor applications.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2009


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