Alban Zaka

According to our database, Alban Zaka authored at least 9 papers between 2012 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance.

Luca Pirro, P. Liebscher, C. Brantz, M. Kessler, H. Herzog, Olaf Zimmerhackl, R. Jain, E. Ebrand, K. Gebauer, Michael Otto, Alban Zaka, Jan Hoentschel

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices.

Luca Pirro, Aarthi Jayakumar, Olaf Zimmerhackl, Dieter Lipp, Ralf Illgen, Armin Muehlhoff, Ronny Pfuetzner, Alban Zaka, Michael Otto, Jan Hoentschel, Yannick Raffel, Konrad Seidel, Ricardo Olivo

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Design Optimization of MV-NMOS for ESD Self-protection in 28nm CMOS technology.

Kyong Jin Hwang, Sagar Premnath Karalkar, Vishal Ganesan, Sevashanmugam Marimuthu, Alban Zaka, Tom Herrmann, Bhoopendra Singh, Robert Gauthier

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias.

Luca Pirro, Alban Zaka, Olaf Zimmerhackl, T. Hermann, Michael Otto, E. M. Bazizi, Jan Hoentschel, X. Li, R. Taylor

Proceedings of the IEEE International Reliability Physics Symposium, 2019

22FDX^® fMAX Optimization through Parasitics Reduction and GM Boost.

Zhixing Zhao, Patrick James Artz, Klaus Hempel, Juergen Faul, Tianbing Chen, Richard Taylor, Jerome Mazurier, Carsten Grass, Jan Hoentschel, David Harame, Steffen Lehmann, Luca Lucci, Yogadissen Andee, Alexis Divay, Luca Pirro, Tom Herrmann, Alban Zaka, Ricardo Sousa

Proceedings of the 49th European Solid-State Device Research Conference, 2019

2018

RTN and LFN Noise Performance in Advanced FDSOI Technology.

Luca Pirro, Olaf Zimmerhackl, Alban Zaka, Lars Müller-Meskamp, Ranjith Nelluri, Tom Hermann, Ignasi Cortes-Mayol, Andreas Huschka, Michael Otto, E. Nowak, Anurag Mittal, Jan Hoentschel

Proceedings of the 48th European Solid-State Device Research Conference, 2018

Novel Back Gate Doping Ultra Low Retention Power 22nm FDSOl SRAM for IOT Application.

Mingcheng Chang, Nigel Chan, Vivek Joshi, Sandra Hecker, Udo Ziller, Petra Poth, Alban Zaka, Tom Herrmann, Seunghwan Seo, Hongsik Yoon, Xin Zou, Zhen Xu, Hema Ramamurthy, Torsten Klick, Gabriele Congedo, Youmean Lee, Elke Erben, Gerd Zschaetzsch, Juergen Faul, Jon Kluth, Joerg Schmid, Ralf Van Bentum, Chad Weintraub

Proceedings of the 48th European Solid-State Device Research Conference, 2018

2014

Advanced TCAD for predictive FinFETs Vth mismatch using full 3D process/device simulation.

E. M. Bazizi, Alban Zaka, Tom Herrmann, Francis Benistant, J. H. M. Tin, J. P. Goh, L. Jiang, M. Joshi, H. van Meer, K. Korablev

Proceedings of the 44th European Solid State Device Research Conference, 2014

2012

Microscopic scale characterization and modeling of transistor degradation under HC stress.

Yoann Mamy Randriamihaja, Vincent Huard, Xavier Federspiel, Alban Zaka, Pierpaolo Palestri, Denis Rideau, David Roy, Alain Bravaix

Microelectron. Reliab., 2012