Eberhard Böhl

According to our database, Eberhard Böhl authored at least 12 papers between 1997 and 2014.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2014

Simple true random number generator for any semi-conductor technology.

Eberhard Böhl

IET Comput. Digit. Tech., 2014

A true random number generator with on-line testability.

Eberhard Böhl, Matthew Lewis, S. Galkin

Proceedings of the 19th IEEE European Test Symposium, 2014

A collision resistant deterministic random bit generator with fault attack detection possibilities.

Eberhard Böhl, Matthew Lewis, Klaus Damm

Proceedings of the 19th IEEE European Test Symposium, 2014

2012

A fault attack robust TRNG.

Eberhard Böhl, Markus Ihle

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

#SAT-based vulnerability analysis of security components - A case study.

Linus Feiten, Matthias Sauer, Tobias Schubert, Alexander Czutro, Eberhard Böhl, Ilia Polian, Bernd Becker

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

2011

Fault attack resistant deterministic random bit generator usable for key randomization.

Eberhard Böhl, Paul Duplys

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

2010

Key randomization using a power analysis resistant deterministic random bit generator.

Paul Duplys, Eberhard Böhl, Wolfgang Rosenstiel

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

2009

Linear and nonlinear MISR operations for safety and security in automotive applications.

Paul Duplys, Eberhard Böhl

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

Nonlinear compression functions using the MISR approach for security purposes in automotive applications.

Eberhard Böhl, Paul Duplys

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

2004

A New Code with Reduced EMI and Partial EC Possibilities.

Eberhard Böhl, Elmar Dilger, M. Böhl

Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

1998

On-Chip IDDQ Testing in the AE11 Fail-Stop Controller.

Eberhard Böhl, Thomas Lindenkreuz, Matthias Meerwein

IEEE Des. Test Comput., 1998

1997

The Fail-Stop Controller AE11.

Eberhard Böhl, Thomas Lindenkreuz, R. Stephan

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997