Eberhard Böhl

According to our database1, Eberhard Böhl authored at least 13 papers between 1997 and 2025.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2025
Artificial Intelligence Enables Increased Data Rate of True Random Number Generator.
Proceedings of the 28th Euromicro Conference on Digital System Design, 2025

2014
Simple true random number generator for any semi-conductor technology.
IET Comput. Digit. Tech., 2014

A true random number generator with on-line testability.
Proceedings of the 19th IEEE European Test Symposium, 2014

A collision resistant deterministic random bit generator with fault attack detection possibilities.
Proceedings of the 19th IEEE European Test Symposium, 2014

2012
A fault attack robust TRNG.
Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

#SAT-based vulnerability analysis of security components - A case study.
Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

2011
Fault attack resistant deterministic random bit generator usable for key randomization.
Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

2010
Key randomization using a power analysis resistant deterministic random bit generator.
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

2009
Linear and nonlinear MISR operations for safety and security in automotive applications.
Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

Nonlinear compression functions using the MISR approach for security purposes in automotive applications.
Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

2004
A New Code with Reduced EMI and Partial EC Possibilities.
Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

1998
On-Chip IDDQ Testing in the AE11 Fail-Stop Controller.
IEEE Des. Test Comput., 1998

1997
The Fail-Stop Controller AE11.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997


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