Alexander Czutro

According to our database, Alexander Czutro authored at least 24 papers between 2005 and 2014.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2014

SAT-Based Test Pattern Generation with Improved Dynamic Compaction.

Alexander Czutro, Sudhakar M. Reddy, Ilia Polian, Bernd Becker

Proceedings of the 2014 27th International Conference on VLSI Design, 2014

Variation-aware deterministic ATPG.

Matthias Sauer, Ilia Polian, Michael E. Imhof, Abdullah Mumtaz, Eric Schneider, Alexander Czutro, Hans-Joachim Wunderlich, Bernd Becker

Proceedings of the 19th IEEE European Test Symposium, 2014

2013

Efficiency and applications of SAT-based test pattern generation: complex fault models and optimisation problems.

Alexander Czutro

PhD thesis, 2013

SAT-Based Analysis of Sensitizable Paths.

Matthias Sauer, Alexander Czutro, Tobias Schubert, Stefan Hillebrecht, Ilia Polian, Bernd Becker

IEEE Des. Test, 2013

2012

SAT-ATPG using preferences for improved detection of complex defect mechanisms.

Alexander Czutro, Matthias Sauer, Tobias Schubert, Ilia Polian, Bernd Becker

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Analysis of Reachable Sensitisable Paths in Sequential Circuits with SAT and Craig Interpolation.

Matthias Sauer, Stefan Kupferschmid, Alejandro Czutro, Sudhakar M. Reddy, Bernd Becker

Proceedings of the 25th International Conference on VLSI Design, 2012

Functional test of small-delay faults using SAT and Craig interpolation.

Matthias Sauer, Stefan Kupferschmid, Alexander Czutro, Ilia Polian, Sudhakar M. Reddy, Bernd Becker

Proceedings of the 2012 IEEE International Test Conference, 2012

Small-delay-fault ATPG with waveform accuracy.

Matthias Sauer, Alexander Czutro, Ilia Polian, Bernd Becker

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

On the quality of test vectors for post-silicon characterization.

Matthias Sauer, Alexander Czutro, Bernd Becker, Ilia Polian

Proceedings of the 17th IEEE European Test Symposium, 2012

Multi-conditional SAT-ATPG for power-droop testing.

Alexander Czutro, Matthias Sauer, Ilia Polian, Bernd Becker

Proceedings of the 17th IEEE European Test Symposium, 2012

#SAT-based vulnerability analysis of security components - A case study.

Linus Feiten, Matthias Sauer, Tobias Schubert, Alexander Czutro, Eberhard Böhl, Ilia Polian, Bernd Becker

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

On the optimality of K longest path generation algorithm under memory constraints.

Jie Jiang, Matthias Sauer, Alexander Czutro, Bernd Becker, Ilia Polian

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

Variation-Aware Fault Grading.

Alexander Czutro, Michael E. Imhof, J. Jiang, Abdullah Mumtaz, Matthias Sauer, Bernd Becker, Ilia Polian, Hans-Joachim Wunderlich

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

Estimation of component criticality in early design steps.

Matthias Sauer, Alejandro Czutro, Ilia Polian, Bernd Becker

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

SAT-based analysis of sensitisable paths.

Matthias Sauer, Alexander Czutro, Tobias Schubert, Stefan Hillebrecht, Ilia Polian, Bernd Becker

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

Efficient SAT-Based Search for Longest Sensitisable Paths.

Matthias Sauer, Jie Jiang, Alejandro Czutro, Ilia Polian, Bernd Becker

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis.

Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker

Int. J. Parallel Program., 2010

2009

An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects.

Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis.

Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker

Proceedings of the VLSI Design 2009: Improving Productivity through Higher Abstraction, 2009

ATPG-based grading of strong fault-secureness.

Marc Hunger, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, Bernd Becker

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

Dynamic Compaction in SAT-Based ATPG.

Alejandro Czutro, Ilia Polian, Piet Engelke, Sudhakar M. Reddy, Bernd Becker

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

A Simulator of Small-Delay Faults Caused by Resistive-Open Defects.

Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker

Proceedings of the 13th European Test Symposium, 2008

2007

Power Droop Testing.

Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker

IEEE Des. Test Comput., 2007

2005

Evolutionary Optimization in Code-Based Test Compression.

Ilia Polian, Alejandro Czutro, Bernd Becker

Proceedings of the 2005 Design, 2005