Eduardo Nogueira

According to our database, Eduardo Nogueira authored at least 9 papers between 2009 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Enhancing Public Safety Situational Awareness Using Edge Intelligence.

Pedro Lira, Stefano Loss, Karine Costa, Daniel Araújo, Aluizio Rocha Neto, Nélio Cacho, Thaís Batista, Everton Cavalcante, Frederico Lopes, Eduardo Nogueira

WiPiEC Journal, 2025

Enhancing Situational Awareness in Public Safety with Frame-Accumulated Face Recognition and Distance-Based Evaluation.

Pedro Lira, Karine Costa, Stefano Loss, Leonardo Lima, Daniel Araújo, Eduardo Nogueira, Aluizio Rocha Neto, Thaís Vasconcelos Batista, Nélio Cacho, Everton Cavalcante, Frederico Lopes

Proceedings of the Intelligent Systems - 35th Brazilian Conference, 2025

2023

Analysis of Electrical Signals by Machine Learning for Classification of Individualized Electronics on the Internet of Smart Grid Things (IoSGT) architecture.

Leonardo B. Marques, Paulo Eugênio, Lucas Bastos, Hugo Santos, Denis Rosário, Eduardo Nogueira, Eduardo Cerqueira, Márcio Eduardo Kreutz, Augusto Neto

J. Internet Serv. Appl., January, 2023

Predictive Fraud Detection: An Intelligent Method for Internet of Smart Grid Things Systems.

Lucas Bastos, Bruno S. Martins, Hugo Santos, Iago Medeiros, Paulo Eugênio, Leonardo B. Marques, Denis Rosário, Eduardo Nogueira, Eduardo Cerqueira, Márcio Eduardo Kreutz, Augusto Neto

J. Internet Serv. Appl., January, 2023

2018

Lifetime of electret microphones by thermal degradation analysis via electroacoustic measurements.

Eduardo Nogueira, Juan Sancho Gil, José-Luis Sánchez-Bote

Microelectron. Reliab., 2018

2016

Accelerated Life Test of high luminosity blue LEDs.

Eduardo Nogueira, Vincenzo Orlando, Javier Ochoa, Antonio Fernandez, Manuel Vázquez

Microelectron. Reliab., 2016

2012

Accelerated life test of high luminosity AlGaInP LEDs.

Eduardo Nogueira, Manuel Vázquez, J. Mateos

Microelectron. Reliab., 2012

2010

Degradation of AlInGaP red LEDs under drive current and temperature accelerated life tests.

Manuel Vázquez, Neftalí Núñez, Eduardo Nogueira, A. Borreguero

Microelectron. Reliab., 2010

2009

Evaluation of AlGaInP LEDs reliability based on accelerated tests.

Eduardo Nogueira, Manuel Vázquez, Neftalí Núñez

Microelectron. Reliab., 2009