Enjun Xiao

According to our database, Enjun Xiao authored at least 4 papers between 2005 and 2006.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2006

Dynamic voltage stress effects on nMOS varactor.

Chuanzhao Yu, J. S. Yuan, Enjun Xiao

Microelectron. Reliab., 2006

2005

Voltage stress-induced hot carrier effects on SiGe HBT VCO.

Chuanzhao Yu, Enjun Xiao, J. S. Yuan

Microelectron. Reliab., 2005

Hot carrier and soft breakdown effects on LNA performance for ultra wideband communications.

Enjun Xiao, P. P. Ghosh, Chuanzhao Yu, J. S. Yuan

Microelectron. Reliab., 2005

Voltage stress-induced performance degradation in NMOSFET mixer.

Chuanzhao Yu, Hong Yang, Enjun Xiao, J. S. Yuan

IEICE Electron. Express, 2005