Chuanzhao Yu

According to our database, Chuanzhao Yu authored at least 10 papers between 2005 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Multi-agent deep reinforcement learning for low-carbon flexible job shop scheduling with variable sublots.

Chuanzhao Yu, Youshan Liu, Chunjiang Zhang, Weiming Shen

Robotics Comput. Integr. Manuf., 2026

2012

A multiband multimode transmitter without driver amplifier.

Omid Oliaei, Mark Kirschenmann, David Newman, Kurt Hausmann, Haolu Xie, Patrick Rakers, Mahib Rahman, Michael Gomez, Chuanzhao Yu, Benjamin Gilsdorf, Kurt Sakamoto

Proceedings of the 2012 IEEE International Solid-State Circuits Conference, 2012

2008

PMOS breakdown effects on digital circuits - Modeling and analysis.

Weidong Kuang, Lizhi Cao, Chuanzhao Yu, Jiann-Shiun Yuan

Microelectron. Reliab., 2008

2006

Dynamic voltage stress effects on nMOS varactor.

Chuanzhao Yu, J. S. Yuan, Enjun Xiao

Microelectron. Reliab., 2006

Study of performance degradations in DC-DC converter due to hot carrier stress by simulation.

Chuanzhao Yu, L. Jiang, Jiann-Shiun Yuan

Microelectron. Reliab., 2006

2005

Low-power CMOS wireless MEMS motion sensor for physiological activity monitoring.

Anwar Sadat, Hongwei Qu, Chuanzhao Yu, J. S. Yuan, Huikai Xie

IEEE Trans. Circuits Syst. I Regul. Pap., 2005

Dynamic stress-induced high-frequency noise degradations in nMOSFETs.

Chuanzhao Yu, J. S. Yuan, Anwar Sadat

Microelectron. Reliab., 2005

Voltage stress-induced hot carrier effects on SiGe HBT VCO.

Chuanzhao Yu, Enjun Xiao, J. S. Yuan

Microelectron. Reliab., 2005

Hot carrier and soft breakdown effects on LNA performance for ultra wideband communications.

Enjun Xiao, P. P. Ghosh, Chuanzhao Yu, J. S. Yuan

Microelectron. Reliab., 2005

Voltage stress-induced performance degradation in NMOSFET mixer.

Chuanzhao Yu, Hong Yang, Enjun Xiao, J. S. Yuan

IEICE Electron. Express, 2005