Feifei He

According to our database, Feifei He authored at least 15 papers between 2010 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

A survey of high utility sequential patterns mining methods.

Ruihua Zhang, Meng Han, Feifei He, Fanxing Meng, Chunpeng Li

J. Intell. Fuzzy Syst., November, 2023

What social characteristics enhance recommender systems? The effects of network embeddedness and preference heterogeneity.

Feifei He, Chunhua Sun, Ye-Zheng Liu

Electron. Commer. Res., September, 2023

MCAD: Multi-teacher Cross-modal Alignment Distillation for efficient image-text retrieval.

Youbo Lei, Feifei He, Chen Chen, Yingbin Mo, Sijia Li, Defeng Xie, Haonan Lu

CoRR, 2023

2022

Distributed Quantum Vote Based on Quantum Logical Operators, a New Battlefield of the Second Quantum Revolution.

Xin Sun, Feifei He, Daowen Qiu, Piotr Kulicki, Mirek Sopek, Meiyun Guo

CoRR, 2022

2021

Schrödinger's Ballot: Quantum Information and the Violation of Arrow's Impossibility Theorem.

Xin Sun, Feifei He, Mirek Sopek, Meiyun Guo

Entropy, 2021

Schrödinger's Ballot: Quantum Information and the Violation of Arrow's Impossibility Theorem.

Xin Sun, Feifei He, Piotr Kulicki, Mirek Sopek

CoRR, 2021

2020

A First Step to the Categorical Logic of Quantum Programs.

Xin Sun, Feifei He

Entropy, 2020

Impossibility of Quantum Bit Commitment, a Categorical Perspective.

Xin Sun, Feifei He, Quanlong Wang

Axioms, 2020

2016

Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks.

Qian Lin, Haipeng Fu, Feifei He, Qian-Fu Cheng

J. Electron. Test., 2016

Identifying micro-inversions using high-throughput sequencing reads.

Feifei He, Yang Li, Yu-Hang Tang, Jian Ma, Huaiqiu Zhu

BMC Genom., 2016

2012

Effect of IC layout on the reliability of CMOS amplifiers.

Feifei He, Cher Ming Tan

Microelectron. Reliab., 2012

Electromigration reliability of interconnections in RF low noise amplifier circuit.

Feifei He, Cher Ming Tan

Microelectron. Reliab., 2012

Degradation behavior of high power light emitting diode under high frequency switching.

Sihan Chen, Cher Ming Tan, Guan Hong Tan, Feifei He

Microelectron. Reliab., 2012

2010

Modeling the effect of barrier thickness and low-k dielectric on circuit reliability using 3D model.

Feifei He, Cher Ming Tan

Microelectron. Reliab., 2010

Circuit level interconnect reliability study using 3D circuit model.

Feifei He, Cher Ming Tan

Microelectron. Reliab., 2010