G. Kamarinos

According to our database, G. Kamarinos authored at least 7 papers between 2003 and 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2011

Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors.

N. A. Hastas, N. Arpatzanis, C. A. Dimitriadis, Julien Brochet, François Templier, G. Kamarinos

Microelectron. Reliab., 2011

2008

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress.

N. Arpatzanis, Argyrios T. Hatzopoulos, Dimitrios H. Tassis, C. A. Dimitriadis, François Templier, Maher Oudwan, G. Kamarinos

Microelectron. Reliab., 2008

2006

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors.

Dimitrios H. Tassis, Argyrios T. Hatzopoulos, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos

Microelectron. Reliab., 2006

Effects of hot carriers in offset gated polysilicon thin-film transistors.

Argyrios T. Hatzopoulos, Dimitrios H. Tassis, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos

Microelectron. Reliab., 2006

2005

Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors.

N. A. Hastas, N. Archontas, C. A. Dimitriadis, G. Kamarinos, T. Nikolaidis, N. Georgoulas, Adonios Thanailakis

Microelectron. Reliab., 2005

2003

Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors.

N. A. Hastas, C. A. Dimitriadis, F. V. Farmakis, G. Kamarinos

Microelectron. Reliab., 2003

Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors.

N. A. Hastas, C. A. Dimitriadis, J. Brini, G. Kamarinos, V. K. Gueorguiev, S. Kaschieva

Microelectron. Reliab., 2003