Ganesan Umanesan

According to our database1, Ganesan Umanesan authored at least 13 papers between 2000 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2022
NoaSci: A Numerical Object Array Library for I/O of Scientific Applications on Object Storage.
Proceedings of the 30th Euromicro International Conference on Parallel, 2022

2019
SAGE: Percipient Storage for Exascale Data Centric Computing.
Parallel Comput., 2019

2018
The SAGE Project: a Storage Centric Approach for Exascale Computing.
CoRR, 2018

The SAGE project: a storage centric approach for exascale computing: invited paper.
Proceedings of the 15th ACM International Conference on Computing Frontiers, 2018

2005
Parallel Decoding Cyclic Burst Error Correcting Codes.
IEEE Trans. Computers, 2005

2003
A Class of Random Multiple Bits in a Byte Error Correcting and Single Byte Error Detecting (S_t/b EC-S_bED) Codes.
IEEE Trans. Computers, 2003

A Class of Codes for Correcting Single Spotty Byte Errors.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2003

2002
Single Byte Error Correcting Codes with Double Bit within a Block Error Correcting Capability for Memory Systems.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2002

Adjacent Double Bit Error Correcting Codes with Single Byte Error Detecting Capability for Memory Systems.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2002

Random Double Bit Error Correcting-Single <i>b</i>-<i>bit</i> Byte Error Correcting (DEC-S<sub>b</sub>EC) Codes for Memory Systems.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2002

A Class of Random Multiple Bits in a Byte Error Correcting (S t/b EC)Codes for Semiconductor Memory Systems.
Proceedings of the 9th Pacific Rim International Symposium on Dependable Computing (PRDC 2002), 2002

2001
A class of systematic t/B-error correcting codes for semiconductor memory systems.
Proceedings of the 2001 IEEE Information Theory Workshop, 2001

2000
Single Byte Error Control Codes with Double Bit within a Block Error Correcting Capability for Semiconductor Memory Systems.
Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 2000


  Loading...