Geewhun Seok

According to our database, Geewhun Seok authored at least 2 papers between 2006 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2012

Write-through method for embedded memory with compression Scan-based testing.

Geewhun Seok, Hong Kim, Baker Mohammad

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

2006

An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint.

Geewhun Seok, Il-soo Lee, Tony Ambler, Baxter F. Womack

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006